Scanning Probe Microscopy

Course Description

In the electronic course "Scanning probe microscopy" the fundamental principles of modern methods of scanning probe microscopy, primarily scanning tunneling microscopy (STM) and scanning force microscopy (SFM), both regarding theory and practice are considered. The physical foundation and theory of STM and SFM as well as the basic measurement modes are treated thoroughly. An overview of other SPM techniques is given. The main parts and the construction of scanning probe microscopes are considered, as well as the materials from which they are made.

The course also dwells on advanced measurement and analysis methods, artefacts, as well as manipulation with STM and SFM. Several examples of the use of SPM techniques in current research are given. The knowledge gained upon the course successful completion will allow students to choose an adequate method or SPM mode for studying surface properties in accordance with the research objectives, critically evaluate the data obtained in terms of the impact of possible artifacts, and process and analyze the results.

Engineering Direction

03.04.02 Physics of Solids 

Программа курса

Module 1. The Physical Basis of Scanning Probe Microscopy 
Module 2. The Scanning Probe Microscope Construction. Scanners
Module 3. Probes of the Scanning Probe Microscope
Module 4. Image Artifacts 
Module 5. Scanning Probe Microscopy of Solids Roughness

Number of hoursCredits

18 weeks, 108 hours, 3 credits

Course author

 Kuznetsov Pavel Viktorovich, Associate Professor at the Division of Experimental Physics TPU 

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