Kursinformation

The discipline is mandatory for students to complete. It builds on the knowledge students acquired while studying general theoretical physics, higher mathematics, general materials science and materials technology, and the fundamentals of solid‑state physics. The discipline also relies on the basic knowledge students gained in physics and mathematics during their secondary school education.

Students are familiar with the key terminology in the fields of thermodynamics, molecular physics, electricity and magnetism, optics, atomic and nuclear physics, as well as with the concepts of the atomic‑molecular theory, chemical interaction, chemical kinetics, and electrochemistry. They also have command of general physics and materials science terminology and understand the main chemical and physical phenomena.

Microstructure. The relationship between structure and properties. Scale levels of structure and methods for their observation. Microstructure parameters: grain size, dislocations and dislocation density, volume fraction of phases.

Module 2. X‑ray Diffractometry

Interaction of X‑rays with matter. X‑ray diffractometer. Detection of X‑rays and measurement of their intensity. Methods of X‑ray structural analysis. Polycrystal method. Principles for determining the crystal structure from the X‑ray diffraction pattern of a polycrystal. Precise determination of lattice parameters. Study of the degree of perfection of grain structure in polycrystals based on the broadening of diffraction peaks. Estimation of particle sizes in nanomaterials.

Module 3. Scanning Electron Microscopy

Types of scanning microscopes. Operating principle and design of a scanning electron microscope. Research methods. Sample preparation for examination using a scanning electron microscope. Application of scanning electron microscopy to solve structural analysis problems.

Module 4. Transmission Electron Microscopy

Interaction of accelerated electrons with matter. Optical scheme and operating principles of a transmission electron microscope. Its main characteristics and the objectives of the method. Contrast and formation of an electron microscopic image. Scattering of electrons by matter. Formation of a diffraction pattern in an electron microscope. Methods and techniques for preparing specimens for research in transmission electron microscopy. Application of transmission electron microscopy to solve structural analysis problems.

Structural characteristics of solids, X‑ray diffractometry, scanning electron microscopy, transmission electron microscopy, metallography, yield strength, dislocations